

—— Research Scientists
Dr. Yunsheng DENG
- Office: Rm.208, Material Characterization and Preparation Center
- Email: dengys@sustech.edu.cn
- Mail Address: Material Characterization and Preparation Center, Southern University of Science and Technology, 518055 Shenzhen, China
Education:
2011-2014 Ph.D. Nagoya University (Japan)
2008-2011 Master University of Science & Technology Beijing
2004-2008 Bachelor Hubei University of Automotive Technology
Professional appointment:
2017.10-present, Engineer at SUSTech
2017.1-2017.10, Associate researcher CIGIT, Chinese Academy of Science
2014.10-2017.1, Assistant researcher CIGIT, Chinese Academy of Science
Research Area:
Contact materials for CMOS; Nanofabrication; DNA sequencing.
Selected Publications:
[1] Deng, Yunsheng, et al. "Impact of crystalline structures on the thermal stability and Schottky barrier height of NiGe/Ge contact." Applied Physics Letters 113.25 (2018): 253503.
[2] Yunsheng Deng, Qimeng Huang, Yue Zhao, Daming Zhou, Cuifeng Ying and Deqiang Wang. "Precise fabrication of a 5 nm graphene nanopore with a helium ion microscope for biomolecule detection." Nanotechnology, 28(2016): 045302.
[3] Deng, Yunsheng, et al. "Epitaxial formation of Ni germanide on Ge (0 0 1) substrate by reactive deposition." Solid-State Electronics 110 (2015): 44-48.