JQHe Research Group

  • 11

    11J.Q. He, E. Vasco, C.L. Jia, and R.H. Wang, Direct observation of a fully-strained dead layer at Ba0.7Sr0.3TiO3/SrRuO3 interface, Appl. Phys. Lett., 87 (2005) 062901 (PDF) 

  • 10

    10J.Q. He , C.L. Jia, V. Vaithyanathan D.G. Schlom, J. Schubert, A. Gerber, H.H. Kohlstedt, and R.H. Wang, Interfacial reaction in the growth of epitaxial SrTiO3 thin films on (100) Si substrates, J. Appl. Phys. 97 (2005)104921 (PDF)

  • 9

    9J.Q. He, E. Vasco, C.L. Jia, R. Dittmann and R.H. Wang, Microstructure of epitaxial Ba0.7Sr0.3TiO3 /SrRuO3 bilayer films on SrTiO3 substrates, J. Appl. Phys.,  97 (2005)104907 (PDF

  • 8

    8. A.R. Teren, R. Thomas, J.Q. He and P. Ehrhart, Comparison of precursors for pulsed organometallic CVD of HfO2 High-k dielectric thin films, Thin solid films, 478 (2005) 206 (PDF)

  • 7

    7. J.Q. He, A. Teren, C.L. Jia, P. Ehrhart, K. Urban

    , R. Waser, R.H. Wang, Microstructure of HfO2 thin films grown on Si substrates J. Crystal growth262(2004)295 (PDF)

  • 6

    6J.Q. He, C.L. Jia, J. Schubert and R.H. Wang, Microstructures of epitaxial La0.7Ca0.3MnO3 thin film grown on SrTiO3 and NdGaO3 substrates, J. Crystal growth, 265 (2004) 241 (PDF)

  • 5

    5. Xin Guo and Jiaqing He,  Hydrothermal Degradation of Cubic Zirconia, Acta Materialia51 (2003) 5123 (PDF)

  • 4

    4. R. Dittmann, R. Plonka, E. Vasco, N. A. Pertsev, J. Q. He, C. L. Jia, S. Hoffmann-Eifert and R. Waser Sharp ferroelectric phase transition in strained single-crystalline SrRuO3/Ba0.7Sr0.3TiO3 /SrRuO3 capacitors, Appl. Phys.Lett.

    ,

    83 (2003) 5011 (PDF)
  • 3

    3. A.R.Teren, P.Ehrhart, R.Waser, J.Q. He, C.L.Jia M.Schumacher, J. Linner, P.K. Baumann T.J.Leedham, S.R.Rushworth, A.C.Jones, Comparison of Hafnium Precursors for the MOCVD of HfO2 for Gate Dielectric Applications,Integrated ferroelectrics, 57 (2003)1163(PDF)

  • 2

    2Jiaqing He, Renhui Wang, Jianian Gui and Cheng Dong, Orthorhombic to Cubic Phase Transition in La1-xCaxMnO3 Perovskites, phys. stat. sol. (b), 229 (2002)1145(PDF)

  • 1

    1J.Q. He , S. Regnery, C.L. Jia, Y.L. Qin, F. Fitsilis, P. Ehrhart, R. Waser, K. Urban and R. H. Wang, Interfacial and microstructural properties of SrTiO3 thin films grown on Si(001)substrates, J. Appl. Phys., 92 (2002) 7200(PDF)